Optical Near-Field Electron Microscopy

Imaging dynamical processes at interfaces and on the nanoscale is of great importance throughout science technology. While light-optical imaging techniques often cannot provide necessary spatial resolution, electron-optical damage specimen cause dose-induced artefacts. Here, Optical Near-field Electron Microscopy (ONEM) proposed, an technique that combines non-invasive probing with light, a high resolution read-out via electron optics. Close to specimen, optical near-fields are converted into spatially varying flux using planar photocathode. The imaged low energy microscopy, enabling label-free nanometric without need scan probe across sample. never exposed damaging electrons.